IETF BibXML

Viewing source data: IEEE_P2668_D-4-2022-04 indexed from relaton-data-ieee
docid.id IEEE P2668/D-4-2022-04
docid.type IEEE
docid.primary True
docid#2.id IEEE P2668™/D-4-2022-04
docid#2.type IEEE
docid#2.primary True
docid#2.scope trademark
docid#3.id 978-1-5044-8899-0
docid#3.type ISBN
docnumber IEEE P2668/D-4-2022-04
language en
type standard
script Latn
date.value 2022
date.type created
date#2.value July 29, 2022
date#2.type published
date#3.value 2022
date#3.type issued
title.content IEEE Draft Standard for Maturity Index of Internet-of-things: Evaluation, Grading and Ranking
title.format text/plain
title.type main
abstract.content This standard (IEEE P2668) defines the maturity index of Internet-of-things (IoT), referred to as IDex. It specifies (1) the formats for the IoT Maturity Index (IDex); (2) the IDex database and the IDex evaluation model database. It also defines the general mechanism of the IDex evaluation pertinent to the applications and technical fields of the IoT objects to be evaluated. The IDex can be applied to IoT devices, networks, applications, algorithms, hardware, software, systems, and infrastructure. With slight modifications, the IDex can be extended to evaluate objects and infrastructure in various services, such as smart city services.
abstract.format text/plain
abstract.script Latn
abstract.language en
fetched Aug. 10, 2022
revdate July 29, 2022
contributor.role publisher
contributor.organization.name Institute of Electrical and Electronics Engineers
contributor.organization.contact.address.city New York
contributor.organization.contact.address.country USA
contributor.organization.url http://www.ieee.org
contributor.organization.abbreviation IEEE
keyword Standards
keyword#2 IEEE Standards
keyword#3 Patents
keyword#4 Regulation
keyword#5 Internet of Things
keyword#6 Warranties
keyword#7 Licenses
keyword#8 Internet-of-things
keyword#9 Maturity Index
keyword#10 IEEE P2668
keyword#11 IDex
id IEEEP2668/D-4-2022-04
editorialgroup.committee Industrial Electronics Society Standards Committee of the IEEE Industrial Electronics Society
docstatus.stage.value Active