docid.id
|
NIST TN 2201
|
docid.type
|
NIST
|
docid.primary
|
True
|
docid#2.id
|
10.6028/NIST.TN.2201
|
docid#2.type
|
DOI
|
type
|
standard
|
doctype
|
standard
|
script
|
Latn
|
date.value
|
April 29, 2022
|
date.type
|
published
|
link.content
|
https://doi.org/10.6028/NIST.TN.2201
|
link.type
|
doi
|
link#2.content
|
https://nvlpubs.nist.gov/nistpubs/TechnicalNotes/NIST.TN.2201.pdf
|
link#2.type
|
pdf
|
title.content
|
Laser-assisted atom probe tomography of c-plane and m-plane InGaN test structures
|
title.format
|
text/plain
|
title.script
|
Latn
|
title.language
|
en
|
fetched
|
Aug. 10, 2022
|
revdate
|
April 29, 2022
|
contributor.role
|
author
|
contributor.person.name.forename.content
|
Norman A.
|
contributor.person.name.forename.script
|
Latn
|
contributor.person.name.surname.content
|
Sanford
|
contributor.person.name.surname.script
|
Latn
|
contributor.person.affiliation.organization.name
|
Physical Measurement Laboratory
|
contributor#2.role
|
publisher
|
contributor#2.organization.name
|
National Institute of Standards and Technology
|
contributor#2.organization.contact.address.city
|
Gaithersburg
|
contributor#2.organization.contact.address.country
|
US
|
contributor#2.organization.contact.address.state
|
MD
|
contributor#2.organization.abbreviation
|
NIST
|
place
|
Gaithersburg, MD
|
series.title.content
|
NIST Technical Notes
|
series.title.format
|
text/plain
|
series.number
|
2201
|
series.type
|
main
|
id
|
NISTTN2201
|